2.830J Control of Manufacturing Processes
2.830J/6.780J Control of Manufacturing Processes (SMA 6303) (Spring 2008, MIT OCW). Taught by Prof. David Hardt and Prof. Duane Boning, this course explores statistical modeling and control in manufacturing processes. Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization. Various forms of process control, including statistical process control, run by run and adaptive control, and real-time feedback control, are covered. Application contexts include semiconductor manufacturing, conventional metal and polymer processing, and emerging micro-nano manufacturing processes. (from ocw.mit.edu)
|2.830J/6.780J Control of Manufacturing Processes
Instructors: Prof. David Hardt and Prof. Duane Boning. Lecture Notes. Exams and Solutions. Assignments and Solutions. This course explores statistical modeling and control in manufacturing processes.