Electrical Engineering 140: Analog Integrated Circuits
Electrical Engineering 140: Analog Integrated Circuits (Fall 2013, UC Berkeley). Instructor: Professor Clark TuCuong Nguyen. Linear Integrated Circuits  Single and multiple stage transistor amplifiers. Operational amplifiers. Feedback amplifiers, 2port formulation, source, load, and feedback network loading. Frequency response of cascaded amplifiers, gainbandwidth exchange, compensation, dominant pole techniques, root locus. Supply and temperature independent biasing and references.
Lecture 27  Feedback Loading, Feedback by Inspection 

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Lecture 01  Admin & Overview, Op Amps 
Lecture 02  Device Models I: Bipolar Junction Transistor Modeling 
Lecture 03  Device Models II: BJT Modeling, MOS Transistors 
Lecture 04  Inspection Analysis: BJTs 
Lecture 05  Inspection Analysis: BJTs, MOS Transistors 
Lecture 06  Frequency Response Inspection Analysis 
Lecture 07  Frequency Response Inspection Analysis, Active Loads 
Lecture 08  Active Loads (cont.) 
Lecture 09  Current Sources 
Lecture 10  Supply & Temperature Independent Biasing, Output Swing 
Lecture 11  Output Swing & Dynamic Range, High Swing Current Sources 
Lecture 12  High Swing Current Sources, Current Source Matching 
Lecture 13  Op Amps & Emitter Coupled Pair 
Lecture 14  Source Coupled Pair, Current Mirror Load, Input Offset Voltage 
Lecture 15  Finite Gain BW, High Gain Op Amps 
Lecture 16  High Gain Op Amps, Compensation, Slew Rate 
Lecture 17  Slew Rate, Output Stages 
Lecture 18  Stability 
Lecture 19 
Lecture 20  Stability (cont.), Compensation: Narrowbanding & PoleSplitting 
Lecture 21  Compensation: Narrowbanding & PoleSplitting, Choosing Cc 
Lecture 22  CMOS Op Amp Compensation, RHP Zero 
Lecture 23  RHP Zero, Nulling the RHP Zero 
Lecture 24  Nulling the RHP Zero, Slew Rate, Settling Time 
Lecture 25  Settling Time, Power Supply Rejection Ratio (PSRR), Feedback 
Lecture 26  Feedback Configurations, Feedback Z (Impedance) 
Lecture 27  Feedback Loading, Feedback by Inspection 
Lecture 28  Feedback by Inspection 